With the use of a quartz sample, films or thin plates with thickness of 50 ~ 500μm can be measurable in the thickness direction.High-accuracy measurement with reading resolution of 1nm.Stable measurement is available with a parallel-shifting sample holder.Estimate how many fringes you will see in the interferometer as the bar cools from 50 C to room temperature. You will be measuring this thermal expansion coefficient using a bar of copper (15 cm long) that is mounted into one arm of an interferometer. Measurement of calibration samples for a standard thermal dilatometer The thermal expansion coefficient of copper near room temperature is 16.7x10-6 K-1.Precise measurement of parts of electronic devices.Quality control measurement of low expansion metal materials.Precise measurement of low expansion glass.Measurement of organic films in the thickness direction.This system is compliant with JIS R3251-1995, Measuring method of the linear thermal expansion coefficient for low expansion glass by laser interferometry. This system is suitable to be used as a calibration system for a standard thermal dilatometer, also to measure absolute thermal expansion measurements of unknown samples. This is a laser thermal expansion measurement system with ultra-high sensitivity developed by the use of the latest optical techniques. High-accuracy measurement of thermal expansion with a minimum resolution of 1nm
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